Eric Joseph

Generalized MEMS lot monitoring using fully-integrated material and structure mechanical analysis

Patrice Minotti, G. Bourbon, Eric Joseph, 2002 .

Electromechanical characterization of screen-printed PZT thick films

Eric Joseph, Patrice Le Moal, Patrick Delobelle, 2000, Symposium on Applied Photonics.

Interferometry system for out-of-plane microdisplacement measurement: application to mechanical expertise of scratch drive actuators

Patrice Minotti, Christophe Gorecki, Eric Joseph, 2003, SPIE Optical Metrology.