S. Hwang

发表

Effects of Al2O3 surface passivation on the radiation hardness of IGTO thin films for thin-film transistor applications

H. Kwon, I. Park, Kie Yatsu, 2021, Applied Surface Science.

Effects of proton beam irradiation on the physical and chemical properties of IGTO thin films with different thicknesses for thin-film transistor applications

H. Kwon, Hyun-Seok Cha, Min-Gyu Shin, 2021 .

Effects of Oxygen Content on Operational Characteristics and Stability of High-Mobility IGTO Thin-Film Transistors during Channel Layer Deposition

H. Kwon, Hyun-Seok Cha, Sang-Hun Song, 2021, Coatings.

Electrical Performance and Stability Improvements of High-Mobility Indium–Gallium–Tin Oxide Thin-Film Transistors Using an Oxidized Aluminum Capping Layer of Optimal Thickness

H. Kwon, Hyun-Seok Cha, Hwan-Seok Jeong, 2020, Electronics.

Electrical Performance and Stability Improvement of p-Channel SnO Thin-Film Transistors Using Atomic-Layer-Deposited Al₂O₃ Capping Layer

Hyuck-In Kwon, Seong-Hyun Hwang, Kang-Hwan Bae, 2020, IEEE Access.

Effective threshold voltage modulation technique for steep-slope 2D atomic threshold switching field-effect transistor

Seung-Hwan Kim, Hyun‐Yong Yu, Euyjin Park, 2023, Materials Today Advances.

Comparative Study on the Separate Extraction of Interface and Bulk Trap Densities in Indium Gallium Zinc Oxide Thin-Film Transistors Using Capacitance–Voltage and Current–Voltage Characteristics

Sunhee Lee, H. Kwon, Myeong-Ho Kim, 2021, Coatings.

Effects of Active Layer Thickness on the Electrical Characteristics and Stability of High-Mobility Amorphous Indium–Gallium–Tin Oxide Thin-Film Transistors

H. Kwon, Hyun-Seok Cha, Hwan-Seok Jeong, 2021, Electronics.

Effects of Annealing Atmosphere on Electrical Performance and Stability of High-Mobility Indium-Gallium-Tin Oxide Thin-Film Transistors

H. Kwon, Hyun-Seok Cha, Hwan-Seok Jeong, 2020, Electronics.

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors

H. Kwon, D. Kim, Saeroonter Oh, 2022, Advanced Electronic Materials.

Wheatstone bridge based offset cancelling method utilizing a JFET as a voltage-controlled resistor

H. Kwon, Hyun-Seok Cha, Sang-Hun Song, 2021, Measurement.