M. Sela
发表
I. Beniaminy,
M. Ben-Bassat,
J. Cheifetz,
1989,
IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record..
M. Ben-Bassat,
D. Ben-Arie,
J. Cheifetz,
1989,
The Sixteenth Conference of Electrical and Electronics Engineers in Israel,.
D. Zamir,
R. Fluhr,
Q. Pan,
2000,
Genetics.