M. Sela

发表

I. Beniaminy, M. Ben-Bassat, J. Cheifetz, 1989, IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record..

M. Ben-Bassat, D. Ben-Arie, J. Cheifetz, 1989, The Sixteenth Conference of Electrical and Electronics Engineers in Israel,.