J. Prom

Oxide breakdown in a metal-SiO/sub 2/-Si capacitor: influence of the metal electrode

G. Sarrabayrouse, K. Kassmi, J. Prom, 1990 .

Electrical conduction in MOS capacitors with an ultra-thin oxide layer

G. Sarrabayrouse, K. Kassmi, G. Sarrabayrouse, 1991 .