B. Kaczer
发表
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
B. Kaczer,
T. Grasser,
P.-J. Wagner,
2011,
2011 International Electron Devices Meeting.
B. Kaczer,
E. Simoen,
C. Claeys,
2016,
2016 31st Symposium on Microelectronics Technology and Devices (SBMicro).
A. Asenov,
G. Groeseneken,
B. Kaczer,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
G. Groeseneken,
B. Kaczer,
P. Weckx,
2014,
2014 IEEE International Reliability Physics Symposium.
G. Groeseneken,
D. Soudris,
B. Kaczer,
2011,
2011 IEEE International Conference on IC Design & Technology.
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Rudy Lauwereins,
Liesbet Van der Perre,
Francky Catthoor,
2014
.
B. Kaczer,
P. Weckx,
D. Linten,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
P. Wambacq,
B. Parvais,
G. Groeseneken,
2017,
2017 Symposium on VLSI Technology.
A. Asenov,
G. Groeseneken,
B. Kaczer,
2014,
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2007,
2007 IEEE International Electron Devices Meeting.
B. Kaczer,
Robin Degraeve,
P. W. Mason,
2000,
2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104).
B. Parvais,
B. Kaczer,
D. Linten,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
B. Parvais,
G. Groeseneken,
G. Gielen,
2015,
2015 IEEE International Integrated Reliability Workshop (IIRW).
B. Parvais,
B. Kaczer,
N. Collaert,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
B. Kaczer,
J. Franco,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
B. Kaczer,
M. Waltl,
G. Rzepa,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
B. Kaczer,
P. Weckx,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
G. Groeseneken,
T. Chiarella,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
G. Groeseneken,
B. Kaczer,
T. Grasser,
2011,
2011 International Reliability Physics Symposium.
B. Parvais,
B. Kaczer,
D. Verkest,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2012,
IEEE Transactions on Device and Materials Reliability.
Tibor Grasser,
B. Kaczer,
Robert O'Connor,
2007
.
Dominique Schreurs,
Guido Groeseneken,
B. Kaczer,
2004
.
B. Kaczer,
T. Grasser,
M. Toledano-Luque,
2012,
2012 28th International Conference on Microelectronics Proceedings.
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2005,
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..
S. De Gendt,
G. Groeseneken,
B. Kaczer,
2014,
2014 IEEE International Reliability Physics Symposium.
G. Groeseneken,
B. Kaczer,
J. Martin-Martinez,
2008,
ESSDERC 2008 - 38th European Solid-State Device Research Conference.
W. Dehaene,
B. Kaczer,
P. Weckx,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
B. Kaczer,
A. Asenov,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
T. Grasser,
P.-J. Wagner,
2010,
2010 International Electron Devices Meeting.
Guido Groeseneken,
B. Kaczer,
Robin Degraeve,
2001
.
A. Asenov,
G. Groeseneken,
B. Kaczer,
2013,
2013 IEEE International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
C. Ciofi,
2002,
Digest. International Electron Devices Meeting,.
G. Groeseneken,
B. Kaczer,
B. Dierickx,
2009,
2009 Spanish Conference on Electron Devices.
B. Kaczer,
T. Grasser,
H. Reisinger,
2014,
2014 IEEE International Reliability Physics Symposium.
R. Degraeve,
B. Kaczer,
F. Crupi,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
G. Groeseneken,
B. Kaczer,
G. Van der Plas,
2011,
2011 IEEE International Integrated Reliability Workshop Final Report.
G. Groeseneken,
B. Kaczer,
B. Kaczer,
2003,
IEEE Electron Device Letters.
G. Groeseneken,
B. Kaczer,
P. Weckx,
2015,
2015 IEEE International Integrated Reliability Workshop (IIRW).
B. Kaczer,
J. Van Houdt,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Barry O'Sullivan,
Tibor Grasser,
B. Kaczer,
2017
.
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2009,
IEEE Transactions on Electron Devices.
B. Kaczer,
T. Grasser,
H. Reisinger,
2012,
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
R. Degraeve,
B. Kaczer,
A. De Keersgieter,
2001,
2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).
S. De Gendt,
G. Groeseneken,
B. Kaczer,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
R. Degraeve,
B. Kaczer,
Guido. Groeseneken,
2010,
2010 Proceedings of the European Solid State Device Research Conference.
S. De Gendt,
B. Kaczer,
W. Zhang,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
H. Reisinger,
2014,
2014 IEEE International Reliability Physics Symposium.
B. Kaczer,
T. Grasser,
D. Linten,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
A. Asenov,
B. Kaczer,
L. Gerrer,
2015,
2015 11th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME).
S. De Gendt,
G. Groeseneken,
B. Kaczer,
2013,
2013 IEEE International Electron Devices Meeting.
G. Groeseneken,
B. Kaczer,
T. Grasser,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.
B. Kaczer,
T. Grasser,
H. Reisinger,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
L. Pantisano,
B. Kaczer,
H. Tigelaar,
2007,
2007 IEEE Symposium on VLSI Technology.
B. Kaczer,
G. Hellings,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
G. Groeseneken,
B. Kaczer,
T. Grasser,
2014,
2014 IEEE International Reliability Physics Symposium.
B. Kaczer,
T. Grasser,
W. Goes,
2008,
2008 IEEE International Reliability Physics Symposium.
B. Kaczer,
M. Toledano-Luque,
2014
.
B. Kaczer,
N. Collaert,
D. Linten,
2008,
2008 IEEE International Reliability Physics Symposium.
S. Van Elshocht,
B. Kaczer,
H. Bender,
2008,
2008 IEEE International Electron Devices Meeting.
E. Augendre,
R. Degraeve,
B. Kaczer,
2003,
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..
Guido Groeseneken,
Jacopo Franco,
B. Kaczer,
2014
.
B. Kaczer,
T. Grasser,
L. Witters,
2014,
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).
B. Kaczer,
B. Govoreanu,
H. Bender,
2010,
2010 International Electron Devices Meeting.
B. Kaczer,
N. Collaert,
A. Nackaerts,
2007,
IEEE Electron Device Letters.
B. Parvais,
B. Kaczer,
E. Simoen,
2016,
2016 IEEE Symposium on VLSI Technology.
B. Kaczer,
D. Linten,
R. Ritzenthaler,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
Z. Ji,
J. Mitard,
2014,
2014 IEEE International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
F. Crupi,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
S. Van Elshocht,
B. Kaczer,
P. Lehnen,
2007,
2007 IEEE International SOI Conference.
E. Vandamme,
R. Degraeve,
B. Kaczer,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
Jerome Mitard,
Guido Groeseneken,
Jacopo Franco,
2011
.
B. Kaczer,
L. Witters,
N. Collaert,
2016,
2016 IEEE Symposium on VLSI Technology.
R. Degraeve,
B. Kaczer,
N. Horiguchi,
2010,
IEEE Electron Device Letters.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
B. Kaczer,
Malgorzata Jurczak,
Zhigang Ji,
2015
.
T. Nigam,
R. Degraeve,
B. Kaczer,
1999,
29th European Solid-State Device Research Conference.
B. Kaczer,
L. Witters,
N. Waldron,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
M. Nelhiebel,
2009,
2009 IEEE International Reliability Physics Symposium.
B. Kaczer,
T. Grasser,
L. Witters,
2013,
IEEE Transactions on Electron Devices.
R. Rooyackers,
B. Kaczer,
S. Locorotondo,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
R. Degraeve,
B. Kaczer,
D. Linten,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
J. Mitard,
G. Groeseneken,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
B. Kaczer,
P. Weckx,
D. Linten,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
A. Asenov,
B. Kaczer,
T. Grasser,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
G. Hellings,
J. Mitard,
2009,
2009 Proceedings of the European Solid State Device Research Conference.
B. Kaczer,
B. Kaczer,
J. Pelz,
1996
.
B. Kaczer,
S. Gerardin,
M. Bagatin,
2006,
IEEE Transactions on Nuclear Science.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2011,
IEEE Transactions on Electron Devices.
R. Degraeve,
B. Kaczer,
E. Simoen,
2006,
IEEE Transactions on Electron Devices.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
R. Degraeve,
B. Kaczer,
B. Govoreanu,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
E. San Andres,
R. Degraeve,
B. Kaczer,
2008,
IEEE Transactions on Electron Devices.
B. Kaczer,
T. Grasser,
G. Eneman,
2010,
2010 IEEE International Reliability Physics Symposium.
B. Kaczer,
T. Grasser,
A. Vais,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Tibor Grasser,
Guido Groeseneken,
Jacopo Franco,
2011
.
Ge deep sub-micron HiK/MG pFETs with superior drive compared to Si HiK/MG state-of-the-art reference
B. Kaczer,
M. Heyns,
M. Meuris,
2006,
2006 International SiGe Technology and Device Meeting.
B. Kaczer,
T. Grasser,
P. Weckx,
2012,
2012 International Conference on Emerging Electronics.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
R. Degraeve,
B. Kaczer,
J. Van Houdt,
2013,
2013 IEEE International Electron Devices Meeting.
B. Kaczer,
D. Lin,
N. Waldron,
2014,
2014 IEEE International Reliability Physics Symposium.
B. Kaczer,
T. Grasser,
W. Goes,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
R. Degraeve,
B. Kaczer,
T. Grasser,
2010,
2010 International Electron Devices Meeting.
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
P. Weckx,
P. Raghavan,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
S. De Gendt,
R. Degraeve,
B. Kaczer,
2005,
IEEE Electron Device Letters.
B. Kaczer,
G. Eneman,
G. Groeseneken,
2007,
IEEE Electron Device Letters.
L. Pantisano,
R. Degraeve,
B. Kaczer,
2002,
Digest. International Electron Devices Meeting,.
B. Kaczer,
Z. Ji,
J. Mitard,
2012,
IEEE Electron Device Letters.
B. Kaczer,
G. Hellings,
L. Witters,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
L. Pantisano,
B. Kaczer,
D. Schreurs,
2004,
64th ARFTG Microwave Measurements Conference, Fall 2004..
R. Degraeve,
B. Kaczer,
B. Govoreanu,
2008,
2008 IEEE International Electron Devices Meeting.
L. Pantisano,
R. Degraeve,
B. Kaczer,
2008,
2008 IEEE International Reliability Physics Symposium.
B. Kaczer,
T. Grasser,
H. Reisinger,
2014,
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
B. Kaczer,
D. Vasileska,
R. Ritzenthaler,
2014,
2014 IEEE International Reliability Physics Symposium.
B. Kaczer,
T. Grasser,
P. Weckx,
2013,
2013 Symposium on VLSI Technology.
L. Pantisano,
R. Degraeve,
B. Kaczer,
2003,
IEEE International Electron Devices Meeting 2003.
B. Kaczer,
Dirk Wouters,
Jorge Kittl,
2009
.
R. Degraeve,
B. Kaczer,
P. Weckx,
2012,
2012 International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2001,
2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2012,
IEEE Transactions on Electron Devices.
B. Kaczer,
M. Nafria,
J. Gago,
2009,
2009 Spanish Conference on Electron Devices.
S. De Gendt,
B. Kaczer,
Zhigang Ji,
2013,
IEEE Transactions on Electron Devices.
A. Mercha,
B. Kaczer,
E. Simoen,
2007,
IEEE Electron Device Letters.
T. Nigam,
R. Degraeve,
B. Kaczer,
1999,
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).
R. Degraeve,
B. Kaczer,
A. Akheyar,
2009,
2009 IEEE International Reliability Physics Symposium.
R. Degraeve,
B. Kaczer,
J. Van Houdt,
2011,
2011 International Electron Devices Meeting.
A. Vandooren,
B. Kaczer,
T. Grasser,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
G. Hellings,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
B. Kaczer,
G. Hellings,
L. Witters,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
Philippe Roussel,
Guido Groeseneken,
B. Kaczer,
2003,
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
S. De Gendt,
R. Degraeve,
B. Kaczer,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
R. Degraeve,
B. Kaczer,
L. Haspeslagh,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
B. Kaczer,
D. Varghese,
M.A. Alam,
2008,
IEEE Transactions on Electron Devices.
Guido Groeseneken,
Felice Crupi,
B. Kaczer,
2003
.
B. Kaczer,
F. Crupi,
G. Groeseneken,
2003,
IEEE Electron Device Letters.
R. Degraeve,
B. Kaczer,
F. Crupi,
2002,
32nd European Solid-State Device Research Conference.