R. Heiderhoff

Characterization of electronic materials and devices by scanning near-field microscopy

L. Balk, R. Heiderhoff, J. Phang, 2007 .

Optical and Structural Characterization of Erbium-Doped TiO2 Xerogel Films Processed on Porous Anodic Alumina

E. A. Stepanova, L. Balk, R. Heiderhoff, 2001 .

Characterization of MPCVD diamond films grown on porous silicon

Ludwig Josef Balk, Ralf Heiderhoff, J. Engemann, 1994, Photonics West - Lasers and Applications in Science and Engineering.