Shahdad Irajpour

Multiple tests for each gate delay fault: higher coverage and lower test application cost

Melvin A. Breuer, Sandeep K. Gupta, Shahdad Irajpour, 2005, IEEE International Conference on Test, 2005..

Testing for crosstalk- and bridge-induced delay faults

Shahdad Irajpour, 2007 .

Analyzing crosstalk in the presence of weak bridge defects

Shahin Nazarian, Melvin A. Breuer, Sandeep K. Gupta, 2003, Proceedings. 21st VLSI Test Symposium, 2003..

Timing-independent testing of crosstalk in the presence of delay producing defects using surrogate fault models

Melvin A. Breuer, Sandeep K. Gupta, Shahdad Irajpour, 2004, 2004 International Conferce on Test.