B. Kruger

Timing requirements for the Sanguine ELF communications system

B. Kruger, 1972 .

Simultaneous Measurement of Carrier Mobility and Recombination Lifetime on a Testchip in MOS-Technology by means of the Shockley-Haynes-Experiment within the Temperature Range 98 K to 398 K

B. Kruger, Th Friese, A. Schmidt, 1993, ESSDERC '93: 23rd European solid State Device Research Conference.

A quasi-microstrip traveling-wave power divider/combiner for use in high-density packages

B. Kruger, I. Bahl, D. Willems, 1993, IEEE Microwave and Guided Wave Letters.

Sanguine system overview

B. Kruger, 1972 .