P. C. Lin

发表

Testing process capability for one-sided specification limit with application to the voltage level translator

W. L. Pearn, P. C. Lin, 2002, Microelectron. Reliab..

Computer program for calculating the p‐value in testing process capability index Cpmk

Wen Lea Pearn, P. C. Lin, 2002 .

Research Capability Measures for Processes with Multiple Characteristics

Wen Lea Pearn, K. S. Chen, P. C. Lin, 2003 .

An investigation into warpages, stresses and keep-out zone in 3D through-silicon-via DRAM packages

Michael Chang, Lawrence Huang, C. Y. Huang, 2014, Microelectron. Reliab..

Assessing non-normally distributed processes by interval estimation of the incapability index Cpp

Jau-Chuan Ke, Yunn-Kuang Chu, P. C. Lin, 2009, Qual. Reliab. Eng. Int..

Capability measures for processes with multiple characteristics

Wen Lea Pearn, P. C. Lin, Kuen-Suan Chen, 2003 .

Testing process performance based on capability index Cpk with critical values

W. L. Pearn, P. C. Lin, W. Pearn, 2004, Comput. Ind. Eng..

TESTING PROCESS CAPABILITY USING THE INDEX Cpmk WITH AN APPLICATION

Wen Lea Pearn, Kuen-Suan Chen, P. C. Lin, 2001 .

Application of the generalized folded-normal distribution to the process capability measures

P. C. Lin, 2005 .

Estimating process capability index C′′pmk for asymmetric tolerances: Distributional properties

Wen Lea Pearn, Kuen-Suan Chen, P. C. Lin, 2002 .

Distributional Properties and Implications of the Estimated Process Incapability Index Ĉnpp

Wen Lea Pearn, K. S. Chen, P. C. Lin, 2003 .

A NEW GENERALIZATION OF Cpm FOR PROCESSES WITH ASYMMETRIC TOLERANCES

Wen Lea Pearn, Kuen-Suan Chen, P. C. Lin, 1999 .

The C”pk index for asymmetric tolerances: Implications and inference

Wen Lea Pearn, Kuen-Suan Chen, P. C. Lin, 2004 .