R. De Smedt
发表
J. Catrysse,
R. De Smedt,
1999,
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261).
S. Criel,
L. Martens,
R. De Smedt,
1996,
Quality Measurement: The Indispensable Bridge between Theory and Reality (No Measurements? No Science! Joint Conference - 1996: IEEE Instrumentation and Measurement Technology Conference and IMEKO Tec.
R. De Smedt,
P. De Langhe,
S. Criel,
1999,
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261).
D. De Zutter,
S. Criel,
L. Martens,
1995,
Proceedings of International Symposium on Electromagnetic Compatibility.
F. Olyslager,
R. De Smedt,
D. De Zutter,
1998,
1998 IEEE EMC Symposium. International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.98CH36253).
W. John,
R. De Smedt,
K. Vervoort,
2001,
2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161).
F. Caignet,
E. Sicard,
R. De Smedt,
1999,
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261).
F. Olyslager,
R. De Smedt,
D. De Zutter,
1999,
1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261).
S. Criel,
B. Demoulin,
R. De Smedt,
2000,
IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016).
L. Martens,
F. Olyslager,
R. De Smedt,
1998,
1998 IEEE EMC Symposium. International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.98CH36253).
S. Criel,
R. De Smedt,
D. De Zutter,
1997,
IEEE 1997, EMC, Austin Style. IEEE 1997 International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.97CH36113).