Stig Oresjo

Confirming electrical connection defects

Horst Mueller, Sunit Bhalla, Kris J. Kanack, 2002 .

Structure and metrology for an analog testability bus

Stig Oresjo, Kenneth P. Parker, John E. McDermid, 1993, Proceedings of IEEE International Test Conference - (ITC).

Integrated circuit testing method under mixed presence of signals and device therefor

Stig Oresjo, Kenneth P. Parker, John E Mcdermid, 1994 .

Test and Inspection as part of the lead-free manufacturing process

Stig Oresjo, 2005 .

A language for describing boundary-scan devices

Stig Oresjo, Kenneth P. Parker, 1990, Proceedings. International Test Conference 1990.

Unpowered opens test with X-ray laminography

Stig Oresjo, 1997, Proceedings International Test Conference 1997.

Unpowered opens test with X-ray laminography

Stig Oresjo, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

A language for describing boundary scan devices

Stig Oresjo, Kenneth P. Parker, 1991, J. Electron. Test..

The Why , Where , What , How , and When of Automated X-ray Inspection By

Stig Oresjo, Glen Leinbach, 2001 .

What to consider when selecting the optimal test strategy

Stig Oresjo, 2004 .