M. Malek

Overlapped subarray testing for wafer scale integration

Miroslaw Malek, E. E. Swartzlander, E. Swartzlander, 1989, [1989] Proceedings International Conference on Wafer Scale Integration.

Graph modeling of parallelism in superscalar architecture-a case study of HP PA-RISC microprocessor

M. Malek, P. Chillakanti, S. A. Shaikh, 1996, Proceedings of SOUTHEASTCON '96.