Katherine Shu-Min Li
发表
Katherine Shu-Min Li,
Jr-Yang Huang,
2008,
2008 17th Asian Test Symposium.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Jia-Lin Wu,
2014,
2014 IEEE 23rd Asian Test Symposium.
Chauchin Su,
Katherine Shu-Min Li,
Chung-Len Lee,
2005,
ASP-DAC.
Liang-Bi Chen,
Katherine Shu-Min Li,
Wan-Jung Chang,
2016,
IEICE Trans. Inf. Syst..
Katherine Shu-Min Li,
Sying-Jyan Wang,
Han-Hsuan Hsu,
2012,
2012 IEEE International Symposium on Circuits and Systems.
Katherine Shu-Min Li,
Meng-Kang Chiang,
2012,
2012 IEEE Asia Pacific Conference on Circuits and Systems.
Melany M. Ciampi,
Enrico Pontelli,
Sanjit A. Seshia,
2017,
IEEE Trans. Educ..
Katherine Shu-Min Li,
Sying-Jyan Wang,
Shun-Jie Huang,
2009,
2009 International Symposium on VLSI Design, Automation and Test.
Yao-Wen Chang,
Chauchin Su,
Katherine Shu-Min Li,
2007,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Katherine Shu-Min Li,
2013,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Peter Yi-Yu Liao,
2020,
2020 IEEE European Test Symposium (ETS).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Jhih-Yu Wei,
2016,
2016 IEEE Asian Hardware-Oriented Security and Trust (AsianHOST).
Tsung-Yi Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2020,
2020 IEEE International Test Conference in Asia (ITC-Asia).
Liang-Bi Chen,
Katherine Shu-Min Li,
Ruei-Ting Gu,
2011,
2011 Asian Test Symposium.
Liang-Bi Chen,
Katherine Shu-Min Li,
Chih-Yun Pai,
2011,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Yao-Wen Chang,
Chauchin Su,
Katherine Shu-Min Li,
2006,
Asia and South Pacific Conference on Design Automation, 2006..
Yingchieh Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2013,
2013 22nd Asian Test Symposium.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Kuo-Lin Peng,
2008,
TODE.
Tsung-Yi Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2016,
2016 IEEE 34th VLSI Test Symposium (VTS).
Katherine Shu-Min Li,
Ruei-Ting Gu,
Bo-Chuan Cheng,
2011,
2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Ming-Hua Hsieh,
2009,
2009 IEEE International Symposium on Circuits and Systems.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Hsiang-Hsueh Chen,
2017,
2017 IEEE 26th Asian Test Symposium (ATS).
Liang-Bi Chen,
Yingchieh Ho,
Katherine Shu-Min Li,
2013,
IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences.
Tsung-Yi Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2016,
2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Kuan-Ting Yeh,
2019,
Integr..
Chauchin Su,
Katherine Shu-Min Li,
Chung-Len Lee,
2004,
13th Asian Test Symposium.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Kuo-Lin Peng,
2006,
2006 15th Asian Test Symposium.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Tung-Hua Yeh,
2011,
2011 IEEE International Conference on IC Design & Technology.
Liang-Bi Chen,
Chia-Wei Tsai,
Katherine Shu-Min Li,
2016,
2016 IEEE International Conference on Consumer Electronics (ICCE).
Yu-Shen Chen,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2019,
2019 56th ACM/IEEE Design Automation Conference (DAC).
Katherine Shu-Min Li,
Jr-Yang Huang,
Yi-Yu Liao,
2009,
2009 Asian Test Symposium.
Kuen-Jong Lee,
Katherine Shu-Min Li,
Hsin-Chen Chen,
2015,
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Bo-Chuan Cheng,
2012,
2012 IEEE Asia Pacific Conference on Circuits and Systems.
Chauchin Su,
Katherine Shu-Min Li,
Jwu E. Chen,
2005,
14th Asian Test Symposium (ATS'05).
Liang-Bi Chen,
Katherine Shu-Min Li,
Wan-Jung Chang,
2016,
2016 IEEE 5th Global Conference on Consumer Electronics.
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis
Katherine Shu-Min Li,
Sying-Jyan Wang,
Jwu E. Chen,
2020,
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Yao-Wen Chang,
Chauchin Su,
Katherine Shu-Min Li,
2005,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Yao-Wen Chang,
Katherine Shu-Min Li,
Yih-Huai Cherng,
2003,
ASP-DAC '03.
Tzung-Pei Hong,
Jerry Chun-Wei Lin,
Katherine Shu-Min Li,
2020,
IEEE Access.
Fault tolerant application-specific NoC topology synthesis for three-dimensional integrated circuits
Liang-Bi Chen,
Katherine Shu-Min Li,
Bo-Chuan Cheng,
2011,
2011 IEEE International SOC Conference.
Liang-Bi Chen,
Katherine Shu-Min Li,
Tsung-Hsing Lin,
2014,
2014 Tenth International Conference on Intelligent Information Hiding and Multimedia Signal Processing.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Leon Chou,
2019,
2019 IEEE International Test Conference (ITC).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Che-Wei Kao,
2014,
2014 IEEE 23rd Asian Test Symposium.
Katherine Shu-Min Li,
2010,
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
Katherine Shu-Min Li,
Sying-Jyan Wang,
Tsung-Huei Tzeng,
2014,
2014 IEEE International Symposium on Circuits and Systems (ISCAS).
Tsung-Yi Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2018,
2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Sying-Jyan Wang,
2017,
ACM Trans. Design Autom. Electr. Syst..
Liang-Bi Chen,
Katherine Shu-Min Li,
Wan-Jung Chang,
2015,
2015 International Conference on Connected Vehicles and Expo (ICCVE).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Peter Yi-Yu Liao,
2020,
IEEE Transactions on Semiconductor Manufacturing.
Liang-Bi Chen,
Katherine Shu-Min Li,
Chung-Heng Chuang,
2014,
The 18th IEEE International Symposium on Consumer Electronics (ISCE 2014).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Yu-Siao Chen,
2013,
2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT).
Katherine Shu-Min Li,
Jr-Yang Huang,
2011,
IEEE Design & Test of Computers.
Low Capture Power Test Generation for Launch-off-Capture Transition Test Based on Don't-Care Filling
Yan-Ting Chen,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2007,
2007 IEEE International Symposium on Circuits and Systems.
Katherine Shu-Min Li,
Yu-Wei Yang,
2009,
2009 Asia and South Pacific Design Automation Conference.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Shih-Cheng Chen,
2008,
2008 IEEE International Symposium on Circuits and Systems.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Kuo-Lin Fu,
2009,
2009 IEEE International Symposium on Circuits and Systems.
Tsung-Yi Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2018,
2018 IEEE 27th Asian Test Symposium (ATS).
Katherine Shu-Min Li,
Chih-Yun Pai,
2010,
2010 19th IEEE Asian Test Symposium.
Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint
Katherine Shu-Min Li,
Sying-Jyan Wang,
Shih-Cheng Chen,
2009,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Liang-Bi Chen,
Katherine Shu-Min Li,
Jing-Jou Tang,
2016,
2016 IEEE International Conference on Consumer Electronics (ICCE).
Katherine Shu-Min Li,
Sying-Jyan Wang,
Ting-Jui Choi,
2016,
2016 IEEE 25th Asian Test Symposium (ATS).
Katherine Shu-Min Li,
Yi-Yu Liao,
2013,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
You-Chiun Wang,
Liang-Bi Chen,
Katherine Shu-Min Li,
2016,
2016 IEEE International Conference on Consumer Electronics (ICCE).
Katherine Shu-Min Li,
K. S. Li,
2013,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Chin-Hung Lien,
2018,
2018 IEEE International Symposium on Circuits and Systems (ISCAS).
Katherine Shu-Min Li,
Jr-Yang Huang,
Yu-Chen Hung,
2009,
2009 Asian Test Symposium.
Katherine Shu-Min Li,
Yi-Yu Liao,
2012,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Chua-Chin Wang,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2009,
Proceedings of the 2009 12th International Symposium on Integrated Circuits.
Yingchieh Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2013,
2013 22nd Asian Test Symposium.
Liang-Bi Chen,
Yingchieh Ho,
Katherine Shu-Min Li,
2014,
IEICE Trans. Inf. Syst..
Shiyan Hu,
Hung-Ming Chen,
Tsung-Yi Ho,
2019,
Microelectron. J..
Tsung-Yi Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2017,
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Liang-Bi Chen,
Katherine Shu-Min Li,
Wan-Jung Chang,
2016,
IEEE Access.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Cheng-Hao Lin,
2013,
2013 IEEE International Symposium on Circuits and Systems (ISCAS2013).
Yingchieh Ho,
Katherine Shu-Min Li,
Sying-Jyan Wang,
2013,
2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT).
Liang-Bi Chen,
Katherine Shu-Min Li,
Ruei-Ting Gu,
2011,
2011 IEEE International Conference on IC Design & Technology.
Chauchin Su,
Katherine Shu-Min Li,
Chung-Len Lee,
2007,
J. Electron. Test..
Katherine Shu-Min Li,
Sying-Jyan Wang,
Ken Chau-Cheung Cheng,
2020,
2020 IEEE 38th VLSI Test Symposium (VTS).
Chauchin Su,
Katherine Shu-Min Li,
Chung-Len Lee,
2009,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Katherine Shu-Min Li,
Sying-Jyan Wang,
Leon Chou,
2020,
2020 IEEE International Test Conference (ITC).