Boon-Khim Liew

Modeling electromigration lifetime under pulsed and AC current stress

Jiang Tao, Chenming Hu, Nathan W. Cheung, 1993, Other Conferences.

Characteristics of deep-submicrometer MOSFET and its empirical nonlinear RF model

Yi-Jen Chan, Boon-Khim Liew, B. Liew, 1998 .

Circuit reliability of hot electron induced degradation in high speed CMOS SRAM

Boon-Khim Liew, A. R. Alvarez, 1993, Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93.

Analysis of interconnect delay for 0.18 /spl mu/m technology and beyond

Shien-Yang Wu, Boon-Khim Liew, C. H. Yu, 1999, Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247).

An analytical model of positive HBM ESD current distribution and the modified multi-finger protection structure

Huey-Liang Hwang, Yi-Hsun Wu, Boon-Khim Liew, 1999, Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394).