Dominique Schryvers

发表

Failure in thin metallic films: on chip testing and size effects

Jean-Pierre Raskin, Thomas Pardoen, Marie-Stéphane Colla, 2014 .

Transmission electron microscopy investigation of dislocation slip during superelastic cycling of Ni-Ti wires

Petr Šittner, Dominique Schryvers, J. Pilch, 2011 .

R-phase transition and related mechanical properties controlled by low-temperature aging treatment in a Ti–50.8 at.% Ni thin wire

Kai Li, Jan Van Humbeeck, Bert Verlinden, 2014 .

Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp

Sara Bals, Hosni Idrissi, Dominique Schryvers, 2018, Materials.

High-Quality Sample Preparation by Low kV FIB Thinning for Analytical TEM Measurements

Sara Bals, Dominique Schryvers, Remco Geurts, 2007, Microscopy and Microanalysis.

Unit cell determination in CuZr martensite by electron microscopy and X-ray diffraction

Dominique Schryvers, J. Van Humbeeck, J. Humbeeck, 1997 .

MICROSTRUCTURE AND FUNCTIONAL PROPERTY CHANGES IN THIN Ni-Ti WIRES HEAT TREATED BY ELECTRIC CURRENT — HIGH ENERGY X-RAY AND TEM INVESTIGATIONS

Petr Šittner, Dominique Schryvers, J. Pilch, 2009 .

Nano-structures at martensite macrotwin interfaces in Ni65Al35

Philippe Boullay, Dominique Schryvers, John M. Ball, 2003 .

The colour of silver stained glass—analytical investigations carried out with XRF, SEM/EDX, TEM, and IBA

Dominique Schryvers, Manfred Schreiner, Joost Caen, 2002 .

Acquisition of the EELS data cube by tomographic reconstruction

Paul Scheunders, Dominique Schryvers, Jo Verbeeck, 2006 .

Microstructural dependence on middle eigenvalue in Ti-Ni-Au

Richard D. James, Dominique Schryvers, R. James, 2014 .