Donghyun Go

Temperature-induced Instability of Retention Characteristics in 3-D NAND Flash Memory

Jeong-Soo Lee, G. Yoon, Ukju An, 2023, IEEE Electron Devices Technology and Manufacturing Conference.

Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Pattern

Jeong-Soo Lee, Jungsik Kim, Jounghun Park, 2021, IEEE Access.

Novel Dummy Cell Programming Scheme to Improve Retention Characteristics in 3-D NAND Flash Memory

G. Yoon, Donghwi Kim, Donghyun Go, 2024, IEEE Transactions on Electron Devices.

Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory

G. Yoon, Ukju An, Donghwi Kim, 2023, Micromachines.