F. J. Xu

Morphology and microstructure evolution of AlxGa1-xN epilayers grown on GaN/sapphire templates with AlN interlayers observed by transmission electron microscopy

Z. Qin, L. Lu, B. Shen, 2008, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology.

Temperature characterization of Raman scattering in an AlGaN/GaN heterostructure

D.J. Chen, R. Zhang, B. Shen, 2005 .