Hao Yu

Modeling and physical mechanism analysis of the effect of a polycrystalline-ferroelectric gate on FE-FinFETs

Chengxu Wang, Xiangshui Miao, Xingsheng Wang, 2023, Science China Information Sciences.

A Unified Physical BTI Compact Model in Variability-Aware DTCO Flow: Device Characterization and Circuit Evaluation on Reliability of Scaling Technology Nodes

Ming Liu, F. Schanovsky, Hong Yang, 2021, Symposium on VLSI Technology.