Y. M. Huang

Electrical simulation on the localized NVM failed cell by AFP nanoproing

C. Q. Chen, G. B. Ang, Z. H. Mai, 2015, 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system

L. Zhu, Ran He, Hao Tan, 2016, Microelectron. Reliab..

Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique

Ran He, Y. Z. Zhao, B. Liu, 2015, Microelectron. Reliab..

Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue

L. Zhu, Ran He, Y. Z. Zhao, 2016, Microelectron. Reliab..

ROBUST VIBRATION CONTROL OF A BEAM USING THE H∞-BASED CONTROLLER WITH MODEL ERROR COMPENSATOR

Y. M. Huang, D.-A. Wang, 2002 .

Pervasive, secure access to a hierarchical sensor-based healthcare monitoring architecture in wireless heterogeneous networks

Y. M. Huang, Y. M. Huang, J. H. Park, 2009, IEEE Journal on Selected Areas in Communications.

Cross-sectional nanoprobing fault isolation technique on submicron devices

L. Zhu, Ran He, Y. Z. Zhao, 2016, Microelectron. Reliab..