John Mellerio

Implications of using ED-50 and probit analysis in comparing retinal injury threshold data

David H. Sliney, Karl Schulmeister, John Mellerio, 2001, SPIE BiOS.

A probabilistic risk analysis model for receiving laser eye injury from space based lasers

David H. Sliney, F. Rattay, Karl Schulmeister, 2002 .