A. Chini
发表
G. Meneghesso,
F. Fantini,
E. Zanoni,
2008,
IEEE Transactions on Device and Materials Reliability.
G. Meneghesso,
E. Zanoni,
G. Verzellesi,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
Giovanni Verzellesi,
Francesco Maria Puglisi,
A. Chini,
2019,
Microelectronics Reliability.
A. Chini,
S. Keller,
S. Heikman,
2004,
IEEE Electron Device Letters.
A. Chini,
D. Buttari,
S. Heikman,
2006,
IEEE Transactions on Electron Devices.
R. Coffie,
A. Chini,
D. Buttari,
2003,
61st Device Research Conference. Conference Digest (Cat. No.03TH8663).
G. Meneghesso,
E. Zanoni,
R. Coffie,
2002,
IEEE Electron Device Letters.
G. Meneghesso,
P. Malberti,
E. Zanoni,
2001,
2001 Electrical Overstress/Electrostatic Discharge Symposium.
R. Coffie,
A. Chini,
D. Buttari,
2004,
IEEE Electron Device Letters.
G. Meneghesso,
F. Fantini,
E. Zanoni,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
G. Meneghesso,
E. Zanoni,
C. Canali,
2002,
Digest. International Electron Devices Meeting,.
G. Meneghesso,
E. Zanoni,
A. Chini,
2009,
IEEE Electron Device Letters.
G. Meneghesso,
E. Zanoni,
C. Canali,
2004,
IEEE Transactions on Electron Devices.
R. Coffie,
A. Chini,
D. Buttari,
2004,
IEEE Electron Device Letters.
G. Meneghesso,
E. Zanoni,
R. Coffie,
2002,
IEEE Electron Device Letters.
V. Paidi,
A. Chini,
Likun Shen,
2004,
Proceedings. IEEE Lester Eastman Conference on High Performance Devices, 2004..
G. Meneghesso,
M. Meneghini,
E. Zanoni,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
G. Meneghesso,
E. Zanoni,
S. Rinaudo,
2013,
The 1st IEEE Workshop on Wide Bandgap Power Devices and Applications.
C. Gaquiere,
G. Meneghesso,
M. Manfredi,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).