Jie Bai

发表

Stresses experienced by AlN films grown on sapphire

M. Khan, J. Lin, Hongxing Jiang, 2005 .

Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

M. Dudley, B. Raghothamachar, G. Dhanaraj, 2006 .