Y.M. Lin

Characterization of Fatigue and Its Recovery Behavior in Ferroelectric HfZrO

R. Lu, P. Liao, S. Yeong, 2021, Symposium on VLSI Technology.

The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics

J. H. Lee, P. McIntyre, P. Liao, 2022, 2022 IEEE International Reliability Physics Symposium (IRPS).