L. Hellemans

Two-dimensional profiling of doped layers bD spreading resistance measurements and atomic force microscopy on chemical etched surfaces

W. Vandervorst, T. Clarysse, V. Privitera, 1993, ESSDERC '93: 23rd European solid State Device Research Conference.

Scanning probe microscopy of biological samples and other surfaces

J. Schneir, L. Hellemans, B. Drake, 1988, Journal of microscopy.