Hyungcheol Shin

发表

TFSOI CMOS technology for sub-1 V microcontroller circuits

J. P. John, W. M. Huang, Marco Racanelli, 1995, Proceedings of International Electron Devices Meeting.

Controlling the device field edge to achieve a low power TFSOI technology

Marco Racanelli, Juergen A. Foerstner, H. C. Shin, 1995, Proceedings of International Electron Devices Meeting.

Gate-Induced Drain Leakage Currents in Metal Oxide Semiconductor Field Effect Transistors with High-κ Dielectric

Jong-Ho Lee, Hyungcheol Shin, Sungi-il Chang, 2002 .

Extraction method for substrate resistance of RF MOSFETs

Minkyu Je, Jeonghu Han, Hyungcheol Shin, 2002, Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002..

Investigation of Random Telegraph Noise in Gate-Induced Drain Leakage and Gate Edge Direct Tunneling Currents of High-$k$ MOSFETs

Byoung Hun Lee, Jong-Ho Lee, Hyungcheol Shin, 2010, IEEE Transactions on Electron Devices.

A Simple Wide-Band MIM Capacitor Model for RF Applications and the Effect of Substrate Grounded Shields

Joonho Gil, Seong-Sik Song, Hyungcheol Shin, 2003 .

Plasma etching antenna effect on oxide-silicon interface reliability

Chenming Hu, Hyungcheol Shin, C. Hu, 1993 .

Plasma etching charge-up damage to thin oxides

Chenming Hu, Hyungcheol Shin, Graham W. Hills, 1993 .

Drain current thermal noise modeling for deep submicron n- and p-channel MOSFETs

Kwangseok Han, Hyungcheol Shin, Kwyro Lee, 2004 .

Simple Wide-Band Metal-Insulator-Metal (MIM) Capacitor Model for RF Applications and Effect of Substrate Grounded Shields

Joonho Gil, Seong-Sik Song, Hyungcheol Shin, 2004 .

Characteristics of p-channel Si nano-crystal memory

Kwangseok Han, Hyungcheol Shin, Ilgweon Kim, 2000 .

Room temperature single electron effects in Si quantum dot memory with oxide-nitride tunneling dielectrics

Jong-Ho Lee, Doyeol Ahn, Hyungcheol Shin, 1998 .

A scalable model for the substrate resistance in multi-finger RF MOSFETs

Jeonghu Han, Hyungcheol Shin, 2003, IEEE MTT-S International Microwave Symposium Digest, 2003.

Simulating process-induced gate oxide damage in circuits

Chenming Hu, Hyungcheol Shin, C. Hu, 1997 .

Non-quasi-static small-signal modeling and analytical parameter extraction of SOI FinFETs

In Man Kang, Hyungcheol Shin, 2006 .

Compact Current Modeling of Fully Depleted Symmetric Double-Gate Metal–Oxide–Semiconductor Field Effect Transistors with Doped Short-Channel

Byung-Kil Choi, Hyuck-In Kwon, Jong-Ho Lee, 2008 .

Polarity-dependent device degradation in SONOS transistors due to gate conduction under nonvolatile memory operations

Young-June Park, Hong Shick Min, Jeong-Hyong Yi, 2006, IEEE Transactions on Device and Materials Reliability.

Design of a 20 nm T-Gate MOSFET with a Source/Drain-to-Gate Non-overlapped Structure

Jong-Ho Lee, Hyunjin Lee, Hyungcheol Shin, 2004 .

50 nm MOSFET with electrically induced source/drain (S/D) extensions

Jong-Ho Lee, Sung-Il Chang, Hyungcheol Shin, 2001 .

TOPICAL REVIEW: Thin gate oxide damage due to plasma processing

Chenming Hu, Hyungcheol Shin, C. Hu, 1996 .

An RF model of the accumulation-mode MOS varactor valid in both accumulation and depletion regions

Seong-Sik Song, Hyungcheol Shin, Hyungcheol Shin, 2003 .

Device degradation model for polysilicon-oxide-nitride-oxide-silicon (SONOS) based on anode hole fluence

Hong Shick Min, Young June Park, Jin-Hong Ahn, 2005 .

Rf modeling of an MOS varactor and MIM capacitor in 0.18-μm CMOS technology

Minkyu Je, Jeonghu Han, Seong-Sik Song, 2002 .

Thermal Noise Model for Short-Channel MOSFETs

Kwangseok Han, Hyungcheol Shin, Kwyro Lee, 2003 .

Gate delay characteristics of a sub-30 nm MOS device with non-overlapping source-drain to gate region

Hyunjin Lee, Sung-Il Chang, Hyungcheol Shin, 2002 .

Fabrication and room-temperature characterization of a silicon self-assembled quantum-dot transistor

Eun Kyu Kim, Sungwoo Hwang, Hyungcheol Shin, 1998 .

Off-state leakage currents of MOSFETs with high-κ dielectrics

Sung-Il Chang, Hyungcheol Shin, Jong-Ho Lee, 2002 .

RF performance of pre-patterned locally-embedded-back-gate graphene device

Jaikwang Shin, Kinam Kim, Inkyeong Yoo, 2010, 2010 International Electron Devices Meeting.

Monitoring plasma-process induced damage in thin oxide

Chenming Hu, Hyungcheol Shin, C. Hu, 1993 .

Room temperature single electron effects in a Si nano-crystal memory

Jong-Ho Lee, Kwangseok Han, Hyungcheol Shin, 1999 .

On-Chip Helical Inductors for CMOS RF-ICs

Joonho Gil, Hyungcheol Shin, Hyungcheol Shin, 2002 .

DC and AC characteristics of sub-50-nm MOSFETs with source/drain-to-gate nonoverlapped structure

Hyunjin Lee, Hyungcheol Shin, Jong-Ho Lee, 2002 .

New surface treatment method for improving the interface characteristics of CdTe/Hg1−xCdxTe heterostructure

Choong Ki Kim, Hyungcheol Shin, C. Kim, 1997 .

A direct method to extract the substrate resistance components of RF MOSFETs valid up to 50 GHz

Jeonghu Han, Hyungcheol Shin, Seyoung Kim, 2004, Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004..

Active and Passive RF Device Compact Modeling in CMOS Technoloies

In Man Kang, Joonho Gil, Hyungcheol Shin, 2006, 2006 International Conference on Simulation of Semiconductor Processes and Devices.

RF Characteristics of 0.18 um CMOS Transistors

Minkyu Je, Jeonghu Han, Kwangseok Han, 2002 .

DC and AC Characteristics of sub-50 nm MOSFETs with Source/Drain-to-Gate Non-overlapped Structure

Hyunjin Lee, Hyungcheol Shin, Jong-Ho Lee, 2002 .

Effects of S/D non-overlap and high-/spl kappa/ dielectrics on nano CMOS design

Jong-Ho Lee, Hyunjin Lee, Sung-Il Chang, 2001, 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497).

13 GHz 4.67 dB NF CMOS low-noise amplifier

Kwangseok Han, Hyungcheol Shin, Joonho Gil, 2003 .

Thickness and other effects on oxide and interface damage by plasma processing

Chenming Hu, Hyungcheol Shin, K. Noguchi, 1993, 31st Annual Proceedings Reliability Physics 1993.

Trench-type deep N-well dual guard ring for the suppression of substrate noise coupling

Jae-Sung Rieh, Yongho Oh, Hyungcheol Shin, 2011 .