Gunter Bartsch

A scalable model based RTL framework zamiaCAD for static analysis

Jaan Raik, Maksim Jenihhin, Rainer Dorsch, 2012, 2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC).

Automated Design Error Localization in RTL Designs

Raimund Ubar, Jaan Raik, Heinz-Dietrich Wuttke, 2014, IEEE Design & Test.

Some common aspects of design validation, debug and diagnosis

Hans-Joachim Wunderlich, Gunter Bartsch, Talal Arnaout, 2006, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06).

Localization of Bugs in Processor Designs Using zamiaCAD Framework

Jaan Raik, Heinz-Dietrich Wuttke, Maksim Jenihhin, 2012, 2012 13th International Workshop on Microprocessor Test and Verification (MTV).