Y. Nissan-Cohen
发表
N. Haik,
D. Gat,
R. Sadon,
1991,
IEEE Electron Device Letters.
Y. Nissan-Cohen,
J. Shappir,
D. Frohman-Bentchkowsky,
1983,
1983 International Electron Devices Meeting.
Y. Nissan-Cohen,
R. Moazzami,
N. Abt,
1991,
1991 Symposium on VLSI Technology.
Y. Nissan-Cohen,
Joseph Shappir,
D. Frohman‐Bentchkowsky,
1984
.
Y. Nissan-Cohen,
Joseph Shappir,
D. Frohman-Bentchkowsky,
1983
.
Y. Nissan-Cohen,
Y. Nissan‐Cohen,
1986,
IEEE Electron Device Letters.
Y. Nissan-Cohen,
S. Bibyk,
H. Wang,
1989,
International Technical Digest on Electron Devices Meeting.
Y. Nissan-Cohen,
E. Avni,
Y. Sonnenblick,
1988
.
Y. Nissan-Cohen,
J. Shappir,
D. Frohman-Bentchkowsky,
1986
.
Y. Nissan-Cohen,
Y. Nissan‐Cohen,
T. Gorczyca,
1988,
IEEE Electron Device Letters.
Y. Nissan-Cohen,
Joseph Shappir,
D. Frohman-Bentchkowsky,
1985
.
Measurement of Fowler-Nordheim tunneling currents in MOS structures under charge trapping conditions
Y. Nissan-Cohen,
J. Shappir,
D. Frohman-Bentchkowsky,
1985
.
Y. Nissan-Cohen,
G.A. Franz,
R.F. Kwasnick,
1986,
IEEE Electron Device Letters.