Richard Putman

Using reiterative LFSR based X-masking to increase output compression in presence of unknowns

Richard Putman, 2008, GLSVLSI '08.

Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation

Nur A. Touba, Richard Putman, Ritesh Garg, 2008, 26th IEEE VLSI Test Symposium (vts 2008).

Enhanced timing-based transition delay testing for small delay defects

Richard Putman, Rahul Gawde, 2006, 24th IEEE VLSI Test Symposium.

Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression

Nur A. Touba, Richard Putman, 2007, 25th IEEE VLSI Test Symposium (VTS'07).