S. O. Gordienko

Characterization of graphene layers by Kelvin probe force microscopy and micro-Raman spectroscopy

V. Lysenko, V. Strelchuk, V. Popov, 2013 .

Effect of vacuum annealing on charge transport and trapping in a-Si1 − xCx:H/c-Si heterostructures

V. Lysenko, Y. Gomeniuk, S. Ashok, 2012 .

Correlation of nanostructure and charge transport properties of oxidized a ‐SiC:H films

V. Lysenko, A. Nazarov, A. Vasin, 2012 .