S.A. Kim

Key hot-carrier degradation model calibration and verification issues for accurate AC circuit-level reliability simulation

Lifeng Wu, A. Kapoor, Wenjie Jiang, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.

Oxide-field dependence of the NMOS hot-carrier degradation rate and its impact on AC-lifetime prediction

S. A. Kim, T. E. Kopley, B. Menberu, 1995, Proceedings of International Electron Devices Meeting.