Christian Enkrich

Numerical investigation of light scattering off split-ring resonators

Roland Klose, Stefan Linden, Lin Zschiedrich, 2005, SPIE Optics + Optoelectronics.

Registration measurement capability of VISTEC LMS IPRO4 with focus on small features

Klaus-Dieter Roeth, Frank Laske, Dieter Adam, 2008, Photomask Japan.

World wide matching of registration metrology tools of various generations

Frank Laske, Dieter Adam, Jochen Bender, 2008, Photomask Technology.

Large-area magnetic metamaterials via compact interference lithography.

Stefan Linden, Martin Wegener, Christian Enkrich, 2007, Optics express.