Michael Immediato

High speed serializing/de-serializing design-for-test method for evaluating a 1 GHz microprocessor

David F. Heidel, Sang H. Dhong, H. Peter Hofstee, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

Enchanced multi-threshold (MTCMOS) circuits using variable well bias

Michael Immediato, Terence B. Hook, Stephen V. Kosonocky, 2001, ISLPED '01.

Designing a testable system on a chip

Rajiv V. Joshi, David F. Heidel, Michael Immediato, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).