Juliano Oliveira

Single event effect: Simulations and analysis on 3N163 PMOS transistor

Renato Giacomini, Juliano Oliveira, Marcilei Aparecida Guazzelli, 2018, 2018 IEEE 19th Latin-American Test Symposium (LATS).

Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects

Nilberto H. Medina, N. Added, V. Aguiar, 2023, Microelectronics Reliability.