D. Bae

发表

Ni/W/Ni ohmic contacts for both n- and p-type 4H-SiC

G. Ahn, Kwangsoo Kim, D. Bae, 2018, Electrical Engineering.

Ni/W/Ni ohmic contacts for both n- and p-type 4H-SiC

Kwangsoo Kim, D. Bae, Chungbu Jeong, 2018, Electrical Engineering.

Improvement of LDI BUMP Stripping Process by Development of Room Temperature PR Stripper

Tae-Sung Kim, Young-Nam Kim, Hyun-joon Kim, 2007 .

Evaluation of Neutron Radiation Impact for 1200-V Class 4H-SiC MOSFET at Gate Switching Mode With TCAD Simulation

S. Wender, Kiseog Kim, Hyeokjae Lee, 2023, IEEE Transactions on Nuclear Science.