V. Simic

发表

Cost estimation of nanoscale partial defect tolerant arrays

I. Milentijevic, V. Ciric, V. Simic, 2012, 2012 16th IEEE Mediterranean Electrotechnical Conference.

Software defects prediction by metaheuristics tuned extreme gradient boosting and analysis based on Shapley Additive Explanations

D. Pamučar, N. Bačanin, B. Nikolić, 2023, Appl. Soft Comput..