Takeki Ninomiya

Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM

Ryutaro Yasuhara, Koji Katayama, Takumi Mikawa, 2013, 2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers.

Theoretical and Experimental Approaches to Select Resistive Switching Material

Shinichi Yoneda, Zhiqiang Wei, Kenji Shiraishi, 2015, IEICE Trans. Electron..

Quantitative method for estimating characteristics of conductive filament in ReRAM

Ryutaro Yasuhara, Koji Katayama, Takumi Mikawa, 2014, 2014 IEEE International Symposium on Circuits and Systems (ISCAS).

Switching and reliability mechanisms for ReRAM

Ryutaro Yasuhara, Takumi Mikawa, Takeki Ninomiya, 2014, IEEE International Interconnect Technology Conference.