V. Gottschalk

Reliability evaluation of Si-dies due to assembly issues

Frank Altmann, Falk Naumann, V. Gottschalk, 2016, Microelectron. Reliab..

Lock-in thermal IR imaging using a solid immersion lens

Frank Altmann, D. Karg, V. Gottschalk, 2006, Microelectron. Reliab..

Lock-in-Thermography for 3- dimensional localization of electrical defects inside complex packaged devices

Frank Altmann, F. Altmann, A. Lindner, 2008 .