Shih-Ya Lin

Temperature-dependent kink effect model for partially-depleted SOI NMOS devices

J. B. Kuo, S. C. Lin, J. Kuo, 1999 .

Modeling the fringing electric field effect on the threshold voltage of FD SOI nMOS devices with the LDD/sidewall oxide spacer structure

J. Kuo, Shih-Chia Lin, Shih-Ya Lin, 2003 .