Wan Sik Nam

Big Data Analysis and Data Mining

Wan Sik Nam, 2015 .

반도체 제조 가상계측 공정변수를 이용한 웨이퍼 수율 예측 / A Prediction of Wafer Yield Using Product Fabrication Virtual Metrology Process Parameters in Semiconductor Manufacturing

Wan Sik Nam, Seoung Bum Kim, S. Kim, 2015 .