Jong-Uk Bae

发表

P‐3: A Study on the Hot Carrier Effect in InGaZnO Thin Film Transistors

Inbyeong Kang, Hara Kang, S. Yoon, 2019, SID Symposium Digest of Technical Papers.

Experimental decomposition of the positive bias temperature stress‐induced instability in self‐aligned coplanar InGaZnO thin‐film transistors and its modeling based on the multiple stretched‐exponential functions

Sung-Jin Choi, D. M. Kim, Saeroonter Oh, 2017 .