T. Kato

Impact of Parasitic Bipolar Effect on Single-Event Upset in p-Type Metal–Oxide–Semiconductor Field Effect Transistor with Embedded SiGe

Taiki Uemura, S. Satoh, Y. Ikeda, 2013 .

Impact of deep p-well structure on single event latchup in bulk CMOS

Hideya Matsuyama, H. Matsuyama, Takashi Kato, 2015, 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).