R. Cruz
发表
Christian Götze,
K. Meier,
M. Schaulin,
2022,
Microelectronics Reliability.
B. Vandevelde,
P. Vernhes,
Chinmay Nawghane,
2023,
2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
M. Schneider-Ramelow,
P. Vernhes,
S. Huber,
2022,
Microelectronics and reliability.