G. Groos

发表

Error analysis in phase extraction in a 2D holographic imaging of semiconductor devices

V. Dubec, Sergey Bychikhin, Dionyz Pogany, 2004, IS&T/SPIE Electronic Imaging.

Theory and experimental validation of a new analytical model for the position-dependent Hall Voltage in devices with arbitrary aspect ratio

G. Groos, M. Stecher, W. Fichtner, 2006, IEEE Transactions on Electron Devices.

Measurement and modeling of the electron impact-ionization coefficient in silicon up to very high temperatures

G. Groos, M. Stecher, W. Fichtner, 2005, IEEE Transactions on Electron Devices.

Simulation and experimental study of temperature distribution during ESD stress in smart-power technology ESD protection structures

Dionyz Pogany, Erich Gornik, G. Groos, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

Coupled bipolar transistors as very robust ESD protection devices for automotive applications

G. Groos, M. Stecher, M. Denison, 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Algorithm for the automatic verification of complex mixed-signal ICs regarding ESD-stress

M. Stecher, G. Groos, H. Reichl, 2005, Research in Microelectronics and Electronics, 2005 PhD.

Laser-Interferometric Investigation of Triggering Behavior in CMOS and Smart Power ESD Protection Structures

Sergey Bychikhin, Dionyz Pogany, Erich Gornik, 2001 .

A new numerical and experimental analysis tool for ESD devices by means of the transient interferometric technique

G. Groos, M. Stecher, M. Rudan, 2005, IEEE Electron Device Letters.

Thermal distribution during destructive pulses in ESD protection devices using a single-shot, two-dimensional interferometric method

V. Dubec, G. Groos, M. Stecher, 2002, Digest. International Electron Devices Meeting,.

Single-shot thermal energy mapping of semiconductor devices with the nanosecond resolution using holographic interferometry

V. Dubec, G. Groos, M. Stecher, 2002, IEEE Electron Device Letters.

Experimental extraction of the electron impact-ionization coefficient at large operating temperatures

G. Groos, M. Stecher, W. Fichtner, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Quantitative internal thermal energy mapping of semiconductor devices under short current stress using backside laser interferometry

Sergey Bychikhin, Dionyz Pogany, Erich Gornik, 2002 .

Moving current filaments in ESD protection devices and their relation to electrical characteristics

Erich Gornik, G. Groos, Matthias Stecher, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

Thermal and free carrier concentration mapping during ESD event in smart Power ESD protection devices using an improved laser interferometric technique

Dionyz Pogany, Erich Gornik, G. Groos, 2000 .

Thermally-driven motion of current filaments in ESD protection devices

Sergey Bychikhin, Dionyz Pogany, Erich Gornik, 2005 .

Investigation of ESD protection elements under high current stress in CDM-like time domain using backside laser interferometry

V. Dubec, G. Groos, M. Stecher, 2002, 2002 Electrical Overstress/Electrostatic Discharge Symposium.

Thermal distribution during destructive pulses in ESD protection devices using a single-shot two-dimensional interferometric method

V. Dubec, Sergey Bychikhin, Dionyz Pogany, 2003 .

Single-shot nanosecond thermal imaging of semiconductor devices using absorption measurements

V. Dubec, Sergey Bychikhin, Dionyz Pogany, 2003 .

Optical patterning of GaN films

G. Groos, Oliver Ambacher, Martin Stutzmann, 1996 .

Extraction of spatio-temporal distribution of power dissipation in semiconductor devices using nanosecond interferometric mapping technique

Sergey Bychikhin, Dionyz Pogany, Erich Gornik, 2002 .

Study of trigger instabilities in smart power technology ESD protection devices using a laser interferometric thermal mapping technique

G. Groos, M. Stecher, H. Gossner, 2001, 2001 Electrical Overstress/Electrostatic Discharge Symposium.