J. Rife

Improved measurement capabilities at the NIST EUV reflectometry facility

C. Tarrio, S. Grantham, T. A. Germer, 2014, Advanced Lithography.

RAIM with Non-Gaussian Errors

J. Rife, P. Misra, P. Misra, 2013 .

Low-cost low-power uncooled 120x160 a-Si-based microinfrared camera for law enforcement applications

J. Rife, John F. Brady, Steven J. Ropson, 2001, SPIE Optics East.

Symmetric Overbounding of Time-Correlated Errors

J. Rife, D. Gebre-Egziabher, 2006 .