C. Marshall

In-flight analysis of enabling technology

C.M. Seidleck, K.A. LaBel, A.K. Moran, 1997, 1997 IEEE Aerospace Conference.

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

R. Reed, D. McMorrow, C. Seidleck, 2004, IEEE Transactions on Nuclear Science.