Xuejun Li

An SEU resilient, SET filterable and cost effective latch in presence of PVT variations

Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, 2016, Microelectron. Reliab..

A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells

Huaguo Liang, Xuejun Li, Zhengfeng Huang, 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia).