C.E. Stroud

Automated BIST for sequential logic synthesis

C.E. Stroud, C. Stroud, 1988, IEEE Design & Test of Computers.

Behavioral model synthesis with Cones

C.E. Stroud, R. R. Munoz, R.R. Munoz, 1988, IEEE Design & Test of Computers.

Non-intrusive built-in self-test for FPGA and MCM applications

C.E. Stroud, A.D. Russ, 1995, Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century'.

Reducing the cost of circular built-in self-test by selective flip-flop replacement

C.E. Stroud, M.G. Sullivan, 1995, Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century'.

A test machine for digital VLSI circuits fabricated through MOSIS. [Student project]

C.E. Stroud, T.A. Fields, 1995, Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century'.

Design of signature registers for double error bit identification

C.E. Stroud, T. Raju Damarla, 1996, 1996 IEEE International Symposium on Circuits and Systems. Circuits and Systems Connecting the World. ISCAS 96.