C. Y. Zhu

Low-frequency noise measurements of electrical stress in InAlN/GaN and AlGaN/GaN heterostructure field-effect transistors

Hadis Morkoç, Ümit Özgür, Xing Li, 2011, OPTO.

Microwave performance of AlGaN/AlN/GaN-based single and coupled channels HFETs

Hadis Morkoç, Ümit Özgür, Xiang Li, 2013, Photonics West - Optoelectronic Materials and Devices.

Degradation analysis of InAlN/AlN/GaN heterostructure field-effect transistors using low-frequency noise and current-transient methods: hot-phonon effects

Hadis Morkoç, Ümit Özgür, Xiang Li, 2012, OPTO.

Investigation of microwave and noise properties of InAlN/GaN HFETs after electrical stress: role of surface effects

Hadis Morkoç, Ümit Özgür, Fan Zhang, 2013, Photonics West - Optoelectronic Materials and Devices.