G. Badenes

Investigation of stress in shallow trench isolation using UV micro-Raman spectroscopy

R. Rooyackers, Kai F. Dombrowski, Ingrid De Wolf, 2001, Microelectron. Reliab..

Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS

Eddy Simoen, Stefaan Decoutere, G. Badenes, 2001, Microelectron. Reliab..

Interface characterization by C(V) measurements of three-terminal MOSOS capacitors

G. Badenes, H. B. Abel, 1991, 1991 IEEE International SOI Conference Proceedings.

SIMOX-devices for analog circuits

Holger Vogt, G. Badenes, G. Burbach, 1991, 1991 IEEE International SOI Conference Proceedings.