K. Fokkens

发表

Comparing HAST results of differently pretreated plastic encapsulated integrated circuits

K. Fokkens, A. Lous, 1989 .

Autoclave tests of 64 K and 256 K SRAMs

K. Fokkens, H. L. A. Polman, 1993 .

Comment on “study of acceleration factor on moisture resistance test of plastic encapsulated semiconductor devices”: T. Wadaet al., Microelectron. Reliab.28, 813–820 (1988)

K. Fokkens, 1989 .